{"id":111870,"date":"2024-10-18T16:17:44","date_gmt":"2024-10-18T16:17:44","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-301-1976\/"},"modified":"2024-10-24T22:02:55","modified_gmt":"2024-10-24T22:02:55","slug":"ieee-301-1976","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-301-1976\/","title":{"rendered":"IEEE 301 1976"},"content":{"rendered":"

New IEEE Standard – Inactive – Superseded. Superseded by 301-1988. These procedures apply to amplifiers and preamplifiers for semiconductor detectors for ionizing radiation.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
7<\/td>\n1.3 Symbols and Abbreviations <\/td>\n<\/tr>\n
8<\/td>\n1 General
Scope and Object
1.2 Definitions <\/td>\n<\/tr>\n
12<\/td>\n1.4 Specification Criteria
Simulating Charge Pulse of a Detector
Precision Pulse Generator
Precision Pulse Generator Waveform <\/td>\n<\/tr>\n
13<\/td>\nPreamplifier Conversion Gain
Measurement of Pulse-Height Distribution Linewidth
Circuit Diagram of Charge Sensitive Preamplifier <\/td>\n<\/tr>\n
14<\/td>\nPreamplifier Output Pulse Decay Time Constant
Definition and Measurement of Main Amplifier Gain
Specifying Amplifier Noise
Decay Time Constant <\/td>\n<\/tr>\n
15<\/td>\n1.10 Specifying Amplifier Nonlinearity
Schematic Representation of Main Amplifier Shaping
Output Signal Parameters <\/td>\n<\/tr>\n
16<\/td>\n1.11 Specifying Main Amplifier Shaping
CircuitforMeasuring tw <\/td>\n<\/tr>\n
17<\/td>\n1.12 Peak Center
Maximum) of the Peak
1.14 Alternative Method for Determination of FWHM and Peak Center (Centroid)
Noise Linewidth Measurements
Noise Measurement by Pulse Height Distribution
Typical Analyzer Display for Noise Measurement <\/td>\n<\/tr>\n
19<\/td>\nNoise Measurement by Oscilloscope and RMS Voltmeter
Preamplifier Noise Performance
3.1 Noise as a Function of Amplifier Shaping
Preamplifier Input
Fixed External Capacitive Loading at Preamplifier Input <\/td>\n<\/tr>\n
20<\/td>\n3.3 Microphonics
Maximum Detector Bias Voltage
Main Amplifier Noise (Equivalent Noise Referred to Input)
Pulse-Height Linearity
Integral Nonlinearity Measurement by Bridge Method
Preamplifier Input for Fixed Amplifier Peaking Time (Time Constant) <\/td>\n<\/tr>\n
21<\/td>\nMeasurement of Integral Nonlinearity by Bridge Method
Typical Waveform of AV <\/td>\n<\/tr>\n
22<\/td>\n5.2 Differential Nonlinearity
5.3 Biased Amplifier
Nonlinearity L D <\/td>\n<\/tr>\n
23<\/td>\nCount RateEffects
6.1 Experimental Arrangement
Signal Sources and System Parameters
Measurement of Integral Nonlinearity L i for Biased Amplifier
System for Measuring Integral Nonlinearity of Biased Amplifiers <\/td>\n<\/tr>\n
24<\/td>\nPulse-Height Distribution Peak Shift
Spectral Resolution Versus Count Rate
7 Overload Effects
7.1 General
From Counting Rate Effects <\/td>\n<\/tr>\n
25<\/td>\nAmplifier Gain Recovery Time
Measurement of Preamplifier Gain Recovery Time
Measurement of Main Amplifier Gain Recovery Time
Example of Amplifier Gain Recovery After Overloading Pulse <\/td>\n<\/tr>\n
26<\/td>\nPulse-Height Dependence on Rise Time
8.1 General
Input Capacitive Loading Effects on Preamplifier Output Pulse
Measurement of Capacitive Loading Effects on Preamplifier
Simulation of Finite Charge-Pulse Rise Time <\/td>\n<\/tr>\n
27<\/td>\nInfluence of Charge Pulse Duration on Pulse Height
Pulse-Height Stability
9.1 Line Voltage Variations
9.2 Temperature Effects
Voltage and Current Waveforms Present in Circuit of Fig <\/td>\n<\/tr>\n
28<\/td>\n9.3 Gain Stability
10 Crossoverwalk
10.1 Crossover Walk Versus Output Amplitude
10.2 Crossover Walk Versus Gain Control Setting
Measurement of Crossover Time Walk <\/td>\n<\/tr>\n
29<\/td>\n11 Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semi- Conductor Radiation Detectors for Ionizing Radiation<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n1976<\/td>\n30<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":111871,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-111870","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/111870","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/111871"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=111870"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=111870"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=111870"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}