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ASTM-E1829:2009 Edition

ASTM-E1829:2009 Edition

$40.63

E1829-09 Standard Guide for Handling Specimens Prior to Surface Analysis

Published By Publication Date Number of Pages
ASTM 2009 5
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1.1 This guide covers specimen handling and preparation prior to surface analysis and applies to the following surface analysis disciplines:

1.1.1 Auger electron spectroscopy (AES),

1.1.2 X-ray photoelectron spectroscopy (XPS or ESCA), and

1.1.3 Secondary ion mass spectrometry (SIMS).

1.1.4 Although primarily written for AES, XPS, and SIMS, these methods may also apply to many surface-sensitive analysis methods, such as ion scattering spectrometry, low-energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface-sensitive measurements.

1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

PDF Catalog

PDF Pages PDF Title
1 Scope
Referenced Documents
Terminology
Significance and Use
General Requirements
2 Specimen Influences
Sources of Specimen Contamination
3 Specimen Storage and Transfer
Keywords
4 X1. LIST OF SPECIMEN TYPES IN ORDER OF DECREASING SENSITIVITY TO HANDLING
X1.1
X1.2
X1.3
X1.4
X1.5
X1.6
X1.7
X1.8
X1.9
X1.10
X1.11
X1.12
X1.13
X2. LIST OF HANDLING CONCERNS IN ORDER OF DECREASING SEVERITY
X2.1
X2.2
X2.3
X2.4
X2.5
X2.6
X2.7
X3. LIST OF CONTAINER TYPES IN ORDER OF DECREASING SPECIMEN PROTECTION
X3.1
X3.2
X3.3
5 X3.4
X3.5
X3.6
X3.7
X3.8
X3.9
REFERENCES

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