ASTM-F1845:2008 Edition
$35.75
F1845-08 Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Resolution Glow Discharge Mass Spectrometer
Published By | Publication Date | Number of Pages |
ASTM | 2008 | 4 |
1.1 This test method determines the concentrations of trace metallic impurities in high purity (99.99 wt. % pure, or purer, with respect to metallic trace impurities) aluminum-copper, aluminum-silicon and aluminum-copper-silicon alloys with major alloy constituents as follows:
1.2 This test method pertains to analysis by magnetic-sector glow discharge mass spectrometer (GDMS).
1.3 This test method does not include all the information needed to complete GDMS analyses. Sophisticated computer-controlled laboratory equipment, skillfully used by an experienced operator, is required to achieve the required sensitivity. This test method does cover the particular factors (for example, specimen preparation, setting of relative sensitivity factors, determination of detection limits, etc.) known by the responsible technical committee to effect the reliability of high purity aluminum analyses.
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
PDF Catalog
PDF Pages | PDF Title |
---|---|
1 | Scope Referenced Documents Terminology Summary of Test Method |
2 | Significance and Use Apparatus Reagents and Materials Preparation of Reference Standards and Test Specimens TABLE 1 |
3 | Preparation of the GDMS Apparatus Instrument Quality Control Standardization Analysis Procedure TABLE 2 |
4 | Detection Limit Determination GDMS Analysis for Thorium, Uranium and Similar Elements Report Precision and Bias Keywords A1. MASS SPECTRUM INTERFERENCES A1.1 TABLE 3 |