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BS EN 60512-26-100:2008+A1:2011

BS EN 60512-26-100:2008+A1:2011

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Connectors for electronic equipment. Tests and measurements – Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 Tests 26a to 26g

Published By Publication Date Number of Pages
BSI 2011 60
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This part of IEC 60512 specifies the test and measurements and the related measurement setup and reference arrangements for interoperability and backward compatibility tests for the development and qualification of 8-way, free and fixed connectors for data transmission.

PDF Catalog

PDF Pages PDF Title
7 English
CONTENTS
11 INTRODUCTION
12 1 Scope
2 Normative reference
13 3 General requirements for measurement setup
3.1 Test instrumentation
3.2 Coaxial cables and test leads for network analysers
3.3 Measurement precautions
14 3.4 Balun requirements
Figures
Figure 1 – Optional 180( hybrid used instead of a balun
Tables
Table 1 – Test balun performance characteristics
15 3.5 Reference components for calibrations
3.6 Termination loads for termination of conductor pairs
Figure 2 – Example of calibration of reference loads
16 3.7 Termination of screens
3.8 Test specimen and reference planes
Figure 3 – Resistor load
17 3.9 Termination of balun with low return loss for common mode
Figure 4 – Definition of reference planes
Figure 5 – Balanced attenuator for balun centre tap grounded
18 4 Connector measurement up to 250 MHz
4.1 Insertion loss (IL), Test 26a
Figure 6 – Balanced attenuator for balun centre tap open
19 Figure 7 – Calibration
Figure 8 – Measuring set-up
20 4.2 Return loss (RL), Test 26b
21 4.3 Near-end crosstalk (NEXT), Test 26c
Table 2 – Uncertainty band of return loss measurement at frequencies below 100 MHz
Table 3 – Uncertainty band of return loss measurement at frequencies above 100 MHz
22 Figure 9 – NEXT measurement for differential and common mode terminations
23 4.4 Far-end crosstalk (FEXT), Test 26d
24 Figure 10 – FEXT measurement for differential and common mode terminations
25 4.5 Transfer impedance (ZT), Test 26e
26 Figure 11 – Preparation of test specimen
27 Figure 12 – Triaxial test set-up
28 Figure 13 – Impedance matching for R1 < 50 Ω
29 Figure 14 – Impedance matching for R1 > 50 Ω
31 4.6 Transverse Conversion Loss (TCL), Test 26f
Figure 15 – TCL measurement
32 4.7 Transverse Conversion Transfer Loss (TCTL), Test 26g
33 Figure 16 – TCTL measurement
34 5 Construction and qualification of test plugs
5.1 De-embedding near-end crosstalk (NEXT) test plug
Figure 17 – Back-to-back through calibration (for more information, see Annex A)
36 Table 4 – De-embedded NEXT real and imaginary reference jack vectors
37 Table 5 – Differential mode reference jack vectors
38 Table 6 – Test plug NEXT loss limits for connectors specified up to 100 MHz according to IEC 60603-7-2 or IEC 60603-7-3
39 Table 7 – Test plug NEXT loss limits for connectors specified up to 250 MHz according to IEC 60603-7-4 or IEC 60603-7-5
40 5.2 Far-end crosstalk (FEXT) test plug
Table 8 – Test-plug differential and differential with common-mode consistency
41 Figure 18 – Mated test plug/direct fixture test configuration
42 5.3 Return loss test plug
6 Reference plug and jack construction and measurement – the basics of the de-embedding test method
6.1 De-embedding near-end crosstalk (NEXT) reference plug and jack
Table 9 – Test plug FEXT requirements – De-embedding method
43 Figure 19 – De-embedding reference plug
44 6.2 De-embedding near-end crosstalk (NEXT) reference jack
Table 10 – Return loss requirements for return loss reference plug
45 Figure 20 – De-embedding reference jack
46 6.3 Determining reference jack FEXT vector
Figure 21 – De-embedding reference FEXT plug without sockets
47 Figure 22 – De-embedding reference FEXT plug with sockets
Figure 23 – Reference FEXT plug mated to PWB
48 Figure 24 – Reference FEXT plug-test lead position
Figure 25 – Reference FEXT plug assembly
50 Figure 26 – Test leads connected to de-embedded reference jack/PWB assembly
Figure 27 – Reference FEXT plug mated to reference jack/PWB assembly
51 Annex A (informative) Example test fixtures in support
Figure A.1 – THI3KIT test head interface with baluns attached
Table A.1 – Coaxial termination reference head component list
52 Table A.2 – Coaxial termination reference head, additional parts
53 Figure A.2 – Alternative to item 3.1 in Table A.2
Figure A.3 – Pyramid test setup for shielded connectors
54 Table A.3 – Coaxial termination reference head component list
55 Figure A.4 – Exploded assembly of the coaxial termination reference test head
Figure A.5 – Detailed view of the coaxial termination reference test-head interface
57 Bibliography

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BS EN 60512-26-100:2008+A1:2011
$198.66