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BS EN IEC 61215-2:2021

BS EN IEC 61215-2:2021

$198.66

Terrestrial photovoltaic (PV) modules. Design qualification and type approval – Test procedures

Published By Publication Date Number of Pages
BSI 2021 60
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IEC 61215-2:2021 is available as IEC 61215-2:2021 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition. IEC 61215-2:2021 lays down requirements for the design qualification of terrestrial photovoltaic modules suitable for long-term operation in open-air climates. This document is intended to apply to all terrestrial flat plate module materials such as crystalline silicon module types as well as thin-film modules. The objective of this test sequence is to determine the electrical characteristics of the module and to show, as far as possible within reasonable constraints of cost and time, that the module is capable of withstanding prolonged exposure outdoors. This second edition of IEC 61215-2 cancels and replaces the first edition of IEC 61215-2 issued in 2016. This edition includes the following significant technical changes with respect to the previous edition: a. Addition of cyclic (dynamic) mechanical load testing (MQT 20). b. Addition of a test for detection of potential-induced degradation (MQT 21). c. Addition of test methods required for bifacial PV modules. d. Addition of test methods required for flexible modules. This includes the addition of the bending test (MQT 22). e. Revision of simulator requirements to ensure uncertainty is both well-defined and minimized. f. Correction to the hot spot endurance test, where the procedure for monolithically integrated (MLI) thin film technologies (MQT 09.2) previously included two sections describing a procedure only appropriate for silicon modules. g. Selection of three diodes, rather than all, for testing in the bypass diode thermal test (MQT 18). h. Removal of the nominal module operating test (NMOT), and associated test of performance at NMOT, from the IEC 61215 series.

PDF Catalog

PDF Pages PDF Title
2 undefined
5 Annex ZA(normative)Normative references to international publicationswith their corresponding European publications
7 English
CONTENTS
11 FOREWORD
13 INTRODUCTION
14 1 Scope
2 Normative references
16 3 Terms and definitions
17 4 Test procedures
4.1 Visual inspection (MQT 01)
4.1.1 Purpose
4.1.2 Procedure
4.1.3 Requirements
4.2 Maximum power determination (MQT 02)
4.2.1 Purpose
4.2.2 Apparatus
18 4.2.3 Procedure
4.3 Insulation test (MQT 03)
4.3.1 Purpose
19 4.3.2 Apparatus
4.3.3 Test conditions
4.3.4 Procedure
Tables
Table 1 – Voltage stress levels
20 4.3.5 Test requirements
4.4 Measurement of temperature coefficients (MQT 04)
4.5 Placeholder section, formerly NMOT
4.6 Performance at STC (MQT 06.1)
4.6.1 Purpose
4.6.2 Apparatus
21 4.6.3 Procedure for measuring at STC (MQT 06.1)
4.7 Performance at low irradiance (MQT 07)
4.7.1 Purpose
4.7.2 Apparatus
22 4.7.3 Procedure
4.8 Outdoor exposure test (MQT 08)
4.8.1 Purpose
4.8.2 Apparatus
4.8.3 Procedure
23 4.8.4 Final measurements
4.8.5 Requirements
4.9 Hot-spot endurance test (MQT 09)
4.9.1 Purpose
4.9.2 Hot-spot effect
24 4.9.3 Classification of cell interconnection
Figures
Figure 1 – Case S, series connection with optional bypass diode
Figure 2 – Case PS, parallel-series connection with optional bypass diode
25 4.9.4 Apparatus
Figure 3 – Case SP, series-parallel connection with optional bypass diode
26 4.9.5 Procedure
Figure 4 – Module I-V characteristics with different cells totally shadowed
28 Figure 5 – Module I-V characteristics with the test cell shadowed at different levels
29 Figure 6 – Hot-spot effect in a MLI thin-film module with serially connected cells
33 4.9.6 Final measurements
4.9.7 Requirements
4.10 UV preconditioning test (MQT 10)
4.10.1 Purpose
4.10.2 Apparatus
34 4.10.3 Procedure
4.10.4 Final measurements
4.10.5 Requirements
4.11 Thermal cycling test (MQT 11)
4.11.1 Purpose
4.11.2 Apparatus
35 4.11.3 Procedure
Figure 7 – Thermal cycling test – Temperature and applied current profile
36 4.11.4 Final measurements
4.11.5 Requirements
Figure 8 – Proper attachment of 5 N weight to junction box for module utilizing a) electrical termination leads, b) or wire for attachment, and c) only one junction box
37 4.12 Humidity-freeze test (MQT 12)
4.12.1 Purpose
4.12.2 Apparatus
4.12.3 Procedure
4.12.4 Final measurements
4.12.5 Requirements
38 4.13 Damp heat test (MQT 13)
4.13.1 Purpose
4.13.2 Apparatus
4.13.3 Procedure
Figure 9 – Humidity-freeze cycle – Temperature and humidity profile
39 4.13.4 Final measurements
4.13.5 Requirements
4.14 Robustness of terminations (MQT 14)
4.14.1 Purpose
4.14.2 Retention of junction box on mounting surface (MQT 14.1)
4.14.3 Test of cord anchorage (MQT 14.2)
40 4.15 Wet leakage current test (MQT 15)
4.15.1 Purpose
4.15.2 Apparatus
4.15.3 Procedure
4.15.4 Requirements
41 4.16 Static mechanical load test (MQT 16)
4.16.1 Purpose
4.16.2 Apparatus
42 4.16.3 Procedure
4.16.4 Final measurements
4.16.5 Requirements
4.17 Hail test (MQT 17)
4.17.1 Purpose
4.17.2 Apparatus
43 4.17.3 Procedure
Figure 10 – Hail-test equipment
Table 2 – Ice-ball masses and test velocities
44 4.17.4 Final measurements
4.17.5 Requirements
Table 3 – Impact locations
45 4.18 Bypass diode testing (MQT 18)
4.18.1 Bypass diode thermal test (MQT 18.1)
Figure 11 – Hail test impact locations: top for wafer/cell based technologies,bottom for monolithic processed thin film technologies
47 Figure 12 – Bypass diode thermal test
48 4.18.2 Bypass diode functionality test (MQT 18.2)
49 4.19 Stabilization (MQT 19)
4.19.1 General
4.19.2 Criterion definition for stabilization
50 4.19.3 Light induced stabilization procedures
51 4.19.4 Other stabilization procedures
4.19.5 Initial stabilization (MQT 19.1)
4.19.6 Final stabilization (MQT 19.2)
52 4.19.7 Stress-specific stabilization – BO LID (MQT 19.3)
4.20 Cyclic (dynamic) mechanical load test (MQT 20)
4.20.1 Purpose
4.20.2 Procedure
4.20.3 Final measurements
53 4.20.4 Requirements
4.21 Potential induced degradation test (MQT 21)
4.21.1 Purpose
4.21.2 Samples
4.21.3 Apparatus
4.21.4 Procedure
4.21.5 Final measurements
54 4.21.6 Requirements
4.22 Bending test (MQT 22)
4.22.1 Purpose
4.22.2 Apparatus
4.22.3 Procedure
4.22.4 Final measurements
4.22.5 Requirements
55 Annex A (informative) Recommended setup for managing weights during mechanical loading (MQT 16)
Figure A.1 – 3D view (at left of figure), end view (at top right), and side view (at bottom right) of gantry crane over mounting jig and loading jig
56 Figure A.2 – 3D close up views of mounting jig (right) and loading jig (left)
57 Figure A.3 – 2D view of mounting jig and loading jig
Figure A.4 – 3D view of loading jig
58 Figure A.5 – Close-up view of loading jig
59 Bibliography

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