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BS EN IEC 61280-4-1:2019

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Fibre-optic communication subsystem test procedures – Installed cabling plant. Multimode attenuation measurement

Published By Publication Date Number of Pages
BSI 2019 84
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IEC 61280-4-1: 2019 is applicable to the measurement of attenuation of installed optical fibre cabling plant using multimode optical fibre. This cabling plant can include multimode optical fibres, connectors, adapters, splices, and other passive devices. The cabling can be installed in a variety of environments including residential, commercial, industrial, and data centre premises, as well as outside plant environments. The test equipment used in this document has one single fibre connector interface or two single fibre connector interfaces. In this document, the optical fibres that are addressed include sub-categories A1-OMx, where x = 2, 3, 4 and 5 (50/125 ?m) and A1-OM1 (62,5/125 ?m) multimode optical fibres, as specified in IEC 60793-2-10. The attenuation measurements of the other multimode categories can be made using the approaches of this document, but the source conditions for the other categories have not been defined. This third edition cancels and replaces the second edition, published in 2009. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) changes to Annex F on encircled flux to harmonise with IEC TR 62614-2, but keeping the encircled flux limits defined in Tables F.2 to F.5 unchanged; b) addition of an equipment cord method in Annex D; c) inclusion of testing bend insensitive multimode optical fibre; d) updates to measurement uncertainty; e) definition of additional cabling configurations; f) changes to Table 5 on spectral requirements. Keywords: measurement of attenuation

PDF Catalog

PDF Pages PDF Title
2 National foreword
5 Annex ZA(normative)Normative references to international publicationswith their corresponding European publications
7 English
CONTENTS
12 FOREWORD
14 1 Scope
2 Normative references
3 Terms, definitions, graphical symbols and abbreviated terms
15 3.1 Terms and definitions
17 3.2 Graphical symbols
18 Figures
FigureĀ 1 ā€“ Connector symbols
FigureĀ 2 ā€“ Symbol for cabling under test
19 3.3 Abbreviated terms
4 Test methods
4.1 General
20 4.2 Cabling configurations and applicable test methods
Tables
TableĀ 1 ā€“ Cabling configurations
TableĀ 2 ā€“ Test methods and configurations
21 FigureĀ 3 ā€“ Reference plane for configuration A tested with the 1-cord method
FigureĀ 4 ā€“ Reference plane for configuration B tested with the 3-cord method
22 5 Overview of uncertainties
5.1 General
5.2 Sources of significant uncertainties
FigureĀ 5 ā€“ Reference plane for configuration C tested with the 2-cord method
FigureĀ 6 ā€“ Reference plane for configuration D tested with the EC method
23 5.3 Consideration of the PM
5.4 Consideration of test cord connector grade
5.5 Typical uncertainty values
TableĀ 3 ā€“ Measurements bias related to test cord connector grade
24 6 Apparatus
6.1 General
6.2 Light source
6.2.1 Stability
6.2.2 Spectral characteristics (LSPM measurement)
TableĀ 4 ā€“ Uncertainty for a given attenuation at 850Ā nm
TableĀ 5 ā€“ Spectral requirements
25 6.3 Launch cord
6.4 Receive or tail cord
26 6.5 Substitution cord
6.6 Power meter ā€“ LSPM methods only
6.7 OTDR apparatus
FigureĀ 7 ā€“ OTDR schematic
27 6.8 Connector end face cleaning and inspection equipment
6.9 Adapters
7 Procedures
7.1 General
7.2 Common procedures
7.2.1 Care of the test cords
7.2.2 Make reference measurements (LSPM methods only)
7.2.3 Inspect and clean the ends of the optical fibres in the cabling
28 7.2.4 Make the measurements
7.2.5 Make the calculations
7.2.6 Duplex and bi-directional testing
7.3 Calibration
7.4 Safety
8 Calculations
9 Documentation
9.1 Information for each test
29 9.2 Information to be available
30 Annexes
Annex A (normative) One-cord method
A.1 Applicability of test method
A.2 Apparatus
A.3 Procedure
31 A.4 Calculation
A.5 Components of reported attenuation
FigureĀ A.1 ā€“ Reference measurement
FigureĀ A.2 ā€“ Test measurement
32 Annex B (normative) Three-cord method
B.1 Applicability of test method
B.2 Apparatus
B.3 Procedure
FigureĀ B.1 ā€“ Reference measurement
33 B.4 Calculations
B.5 Components of reported attenuation
FigureĀ B.2 ā€“ Test measurement
34 Annex C (normative) Two-cord method
C.1 Applicability of test method
C.2 Apparatus
C.3 Procedure
FigureĀ C.1 ā€“ Reference measurement
35 C.4 Calculations
C.5 Components of reported attenuation
FigureĀ C.2 ā€“ Test measurement
FigureĀ C.3 ā€“ Test measurement for plug-socket style connectors
37 Annex D (normative) Equipment cord method
D.1 Applicability of the test method
D.2 Apparatus
D.3 Procedure
38 D.4 Calculation
D.5 Components of reported attenuation
FigureĀ D.1 ā€“ Reference measurement
FigureĀ D.2 ā€“ Test measurement
39 D.6 Typical uncertainty values
TableĀ D.1 ā€“ Uncertainty for a given attenuation at 850Ā nm
40 Annex E (normative) Optical time domain reflectometer
E.1 Applicability of the test method
E.2 Apparatus
E.2.1 General
E.2.2 OTDR
E.2.3 Test cords
41 E.3 Procedure (test method)
FigureĀ E.1 ā€“ OTDR method
42 E.4 Calculation
E.4.1 General
E.4.2 Connection location
FigureĀ E.2 ā€“ Location of the ports of the cabling under test
43 E.4.3 Definition of power levels F1 and F2
E.4.4 Alternative calculation
FigureĀ E.3 ā€“ Graphic construction of F1 and F2
45 E.5 OTDR uncertainties
FigureĀ E.4 ā€“ Graphic construction of F1, F11, F12 and F2
47 Annex F (normative) Requirements for the source characteristics
F.1 Encircled flux
F.2 Assumptions and limitations
F.3 Encircled flux templates
F.3.1 General
48 F.3.2 Uncertainties expectations
F.3.3 Templates
TableĀ F.1 ā€“ Attenuation, threshold tolerance and confidence level
TableĀ F.2 ā€“ EF requirements for 50Ā Āµm core optical fibre cabling at 850Ā nm
49 F.4 Graphical representation of templates
TableĀ F.3 ā€“ EF requirements for 50Ā Ī¼m core optical fibre cabling at 1Ā 300Ā nm
TableĀ F.4 ā€“ EF requirements for 62,5Ā Ī¼m core optical fibre cabling at 850Ā nm
TableĀ F.5 ā€“ EF requirements for 62,5Ā Ī¼m core optical fibre cabling at 1Ā 300Ā nm
50 FigureĀ F.1 ā€“ Encircled flux example
51 Annex G (informative) OTDR configuration information
G.1 General
52 G.2 Fundamental parameters that define the operational capability of an OTDR
G.2.1 Dynamic range
G.2.2 Pulse width
G.2.3 Averaging time
G.2.4 Dead zone
G.3 Other parameters
G.3.1 Index of refraction
53 G.3.2 Measurement range
G.3.3 Distance sampling
G.4 Other measurement configurations
G.4.1 General
G.4.2 Macrobend or splice attenuation measurement
TableĀ G.1 ā€“ Default effective group index of refraction values
54 G.4.3 Splice attenuation measurement
G.4.4 Measurement with high reflection connectors or short length cabling
FigureĀ G.1 ā€“ Splice and macrobend attenuation measurement
55 FigureĀ G.2 ā€“ Attenuation measurement with high reflection connectors
56 G.4.5 Ghost
FigureĀ G.3 ā€“ Attenuation measurement of a short length cabling
57 G.5 More on the measurement method
FigureĀ G.4 ā€“ OTDR trace with ghost
58 G.6 Bi-directional measurement
FigureĀ G.5 ā€“ Cursor positioning
59 G.7 Non-recommended practices
G.7.1 Measurement without tail test cord
G.7.2 Cursor measurement
60 Annex H (informative) Test cord attenuation verification
H.1 General
H.2 Apparatus
H.3 Procedure
H.3.1 General
61 H.3.2 Test cord verification for the one-cord and two-cord methods when using non-pinned/unpinned and non-plug/socket style connectors
62 H.3.3 Test cord verification for the one-cord and two-cord methods when using pinned/unpinned or plug/socket style connectors
FigureĀ H.1 ā€“ Obtaining reference power level P0
FigureĀ H.2 ā€“ Obtaining power level P1
63 FigureĀ H.3 ā€“ Obtaining reference power level P0
FigureĀ H.4 ā€“ Obtaining power level P1
64 H.3.4 Test cord verification for the three-cord method when using non-pinned/unpinned and non-plug/socket style connectors
FigureĀ H.5 ā€“ Obtaining reference power level P0
FigureĀ H.6 ā€“ Obtaining power level
65 FigureĀ H.7 ā€“ Obtaining reference power level P0
FigureĀ H.8 ā€“ Obtaining power level P1
66 H.3.5 Test cord verification for the three-cord method when using pinned/unpinned or plug/socket style connectors
FigureĀ H.9 ā€“ Obtaining power level P5
67 FigureĀ H.10 ā€“ Obtaining reference power level P0
FigureĀ H.11 ā€“ Obtaining power level P1
68 Annex I (normative) On the use of reference-grade test cords
I.1 General
I.2 Practical configurations and assumptions
I.2.1 Component specifications
69 I.2.2 Conventions
I.2.3 Reference planes
I.3 Impact of using reference grade test cords for recommended LSPM methods
70 I.4 Examples for LSPM measurements
I.4.1 ExampleĀ 1 (configuration A, 1-C method ā€“ AnnexĀ A)
I.4.2 ExampleĀ 2 (configuration D, EC method ā€“ AnnexĀ D)
TableĀ I.1 ā€“ Measurement bias when using reference-grade test cords
71 I.5 Impact of using reference-grade test cords for different configurations using the OTDR test method
I.5.1 Cabling configurations A, B and C
FigureĀ I.1 ā€“ Cabling configurations A, B and C tested with the OTDR method
72 I.5.2 Cabling configuration D
Table I.2 ā€“ Measurement bias when using reference grade test cords ā€“ OTDR test method
73 FigureĀ I.2 ā€“ Cabling configuration D tested with the OTDR method
74 Annex J (informative) Launch cord output near-field verification
J.1 Direct verification
J.2 Test equipment manufacturer verification
J.3 Field check with physical artefact
J.3.1 General
75 FigureĀ J.1 ā€“ Initial power measurement
FigureĀ J.2 ā€“ Verification of reference-grade connection
FigureĀ J.3 ā€“ Two offset splices
76 J.3.2 Procedure for attenuation characterization of artefacts
J.3.3 Construction details
FigureĀ J.4 ā€“ Five offset splices
77 J.3.4 Example results
FigureĀ J.5 ā€“ EF centred
78 FigureĀ J.6 ā€“ EF underfilling
FigureĀ J.7 ā€“ EF overfilling
79 FigureĀ J.8 ā€“ L1 attenuation with mandrel
FigureĀ J.9 ā€“ L1 attenuation with mandrel and mode conditioner
FigureĀ J.10 ā€“ L2 attenuation with mandrel
80 FigureĀ J.11 ā€“ L2 attenuation with mandrel and mode conditioning
FigureĀ J.12 ā€“ L3 attenuation with mandrel
FigureĀ J.13 ā€“ L3 attenuation with mandrel and mode conditioning
81 Bibliography
BS EN IEC 61280-4-1:2019
$215.11