BS EN IEC/IEEE 63195-1:2023
$215.11
Assessment of power density of human exposure to radio frequency fields from wireless devices in close proximity to the head and body (frequency range of 6 GHz to 300 GHz) – Measurement procedure
| Published By | Publication Date | Number of Pages |
| BSI | 2023 | 150 |
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | undefined |
| 5 | Annex ZA (normative)Normative references to international publicationswith their corresponding European publications |
| 6 | Blank Page |
| 7 | English CONTENTS |
| 14 | FOREWORD |
| 16 | INTRODUCTION |
| 17 | 1 Scope |
| 18 | 2 Normative references 3 Terms and definitions 3.1 Exposure metrics and parameters |
| 21 | 3.2 Spatial, physical, and geometrical parameters associated with exposure metrics |
| 22 | 3.3 Measurement instrumentation, field probe, and data-processing parameters |
| 25 | 3.4 RF power parameters |
| 26 | 3.5 Test device technical operating and antenna parameters |
| 28 | 3.6 Test device physical configurations |
| 29 | 3.7 Uncertainty parameters |
| 30 | 4 Symbols and abbreviated terms 4.1 Symbols 4.1.1 Physical quantities |
| 31 | 4.1.2 Constants 4.2 Abbreviated terms |
| 32 | 5 Quick start guide and application of this document 5.1 Quick start guide |
| 33 | Tables Table 1 โ Evaluation plan check-list |
| 34 | Figures Figure 1 โ Quick Start Guide |
| 35 | 5.2 Application of this document 5.3 Stipulations 6 Measurement system and laboratory requirements 6.1 General requirements |
| 36 | 6.2 Laboratory requirements |
| 37 | 6.3 Field probe requirements 6.4 Measurement instrumentation requirements |
| 38 | 6.5 Scanning system requirements 6.5.1 Single-probe systems 6.5.2 Multiple field-probe systems |
| 39 | 6.6 Device holder requirements |
| 40 | 6.7 Post-processing quantities, procedures, and requirements 6.7.1 Formulas for calculation of sPD |
| 42 | 6.7.2 Post-processing procedure |
| 43 | 6.7.3 Requirements Figure 2 โ Simplified view of a generic measurement setupinvolving the use of reconstruction algorithms |
| 44 | 7 Protocol for PD assessment 7.1 General 7.2 Measurement preparation 7.2.1 Relative system check 7.2.2 DUT requirements |
| 45 | 7.2.3 DUT preparation |
| 46 | 7.2.4 Selecting evaluation surfaces |
| 47 | Figure 3 โ Cross-sectional view of SAM phantom for SAR evaluationsat the reference plane, as described in IEC/IEEE 62209-1528:2020 Figure 4 โ Cross-sectional view of SAM virtual phantom for PD evaluations at the reference plane (shell thickness is 2 mm everywhere, including at the pinna) |
| 49 | 7.3 Tests to be performed 7.3.1 General Figure 5 โ Example reference coordinate system forthe left-ear ERP of the SAM phantom Figure 6 โ Example reference points and vertical and horizontal lines on a DUT |
| 51 | 7.3.2 Tests to be performed when supported by simulations of the antenna array Figure 7 โ Flow chart for test procedure in 7.3 |
| 53 | 7.3.3 Tests to be performed by measurements of the antenna array 7.4 Measurement procedure 7.4.1 General measurement procedure |
| 54 | 7.4.2 Power density assessment methods Figure 8 โ Flow chart for general measurement procedure in 7.4.1 |
| 55 | Figure 9 โ Flow chart for power density assessment methods in 7.4.2 Table 2 โ Minimum evaluation distance between the DUT antenna andthe evaluation surface for which the plane wave equivalent approximation applies |
| 56 | 7.4.3 Power scaling for operating mode and channel |
| 58 | 7.4.4 Correction for DUT drift |
| 59 | 7.5 Exposure combining 7.5.1 General |
| 60 | 7.5.2 Combining power density and SAR results |
| 62 | Figure 10 โ SAR and power density evaluation at a point r Figure 11 โ Combining SAR (top) and power density (bottom) for the SAM phantom |
| 63 | 8 Uncertainty estimation 8.1 General 8.2 Requirements for uncertainty evaluations 8.3 Description of uncertainty models |
| 64 | 8.4 Uncertainty terms dependent on the measurement system 8.4.1 CAL โ Calibration of the measurement equipment 8.4.2 COR โ Probe correction 8.4.3 FRS โ Frequency response |
| 65 | 8.4.4 SCC โ Sensor cross coupling |
| 66 | 8.4.5 ISO โ Isotropy 8.4.6 LIN โ System linearity error 8.4.7 PSC โ Probe scattering |
| 67 | 8.4.8 PPO โ Probe positioning offset 8.4.9 PPR โ Probe positioning repeatability |
| 68 | 8.4.10 SMO โ Sensor mechanical offset 8.4.11 PSR โ Probe spatial resolution 8.4.12 FLD โ Field impedance dependence (ratio |E|/|H|) 8.4.13 MED โ Measurement drift |
| 69 | 8.4.14 APN โ Amplitude and phase noise 8.4.15 TR โ Measurement area truncation 8.4.16 DAQ โ Data acquisition 8.4.17 SMP โ Sampling 8.4.18 REC โ Field reconstruction |
| 70 | 8.4.19 SNR โ Signal-to-noise ratio 8.4.20 TRA โ Forward transformation and backward transformation |
| 71 | 8.4.21 SCA โ Power density scaling 8.4.22 SAV โ Spatial averaging 8.4.23 COM โ Exposure combining 8.5 Uncertainty terms dependent on the DUT and environmental factors 8.5.1 PC โ Probe coupling with DUT |
| 72 | 8.5.2 MOD โ Modulation response 8.5.3 IT โ Integration time |
| 73 | 8.5.4 RT โ Response time 8.5.5 DH โ Device holder influence 8.5.6 DA โ DUT alignment 8.5.7 AC โ RF ambient conditions 8.5.8 TEM โ Laboratory temperature |
| 74 | 8.5.9 REF โ Reflections in laboratory 8.5.10 MSI โ Measurement system immunity/secondary reception 8.5.11 DRI โ DUT drift 8.6 Combined and expanded uncertainty |
| 75 | Table 3 โ Template of measurement uncertainty for power density measurements |
| 77 | Table 4 โ Example measurement uncertainty budget forpower density measurement results |
| 78 | 9 Measurement report 9.1 General 9.2 Items to be recorded in measurement reports |
| 81 | Annex A (normative)Measurement system check and system validation tests A.1 Overview |
| 82 | A.2 Normalization to total radiated power A.2.1 General A.2.2 Option 1: Accepted power measurement |
| 83 | Figure A.1 โ Recommended accepted power measurement setupfor relative system check, absolute system check and system validation Figure A.2 โ Equipment setup for measurement offorward power Pf and forward coupled power Pfc Figure A.3 โ Equipment setup for measuringthe shorted reverse coupled power Prcs |
| 84 | Figure A.4 โ Equipment setup for measuring thepower with the reference antenna |
| 85 | Figure A.5 โ Port numbering for the S-parametermeasurements of the directional coupler |
| 86 | A.2.3 Option 2: Total radiated power measurement Table A.1 โ Example of power measurement uncertainty |
| 87 | A.3 Relative system check A.3.1 Purpose A.3.2 Antenna and test conditions |
| 88 | A.3.3 Procedure A.3.4 Acceptance criteria |
| 90 | A.4 Absolute system check A.4.1 Purpose A.4.2 Antenna and test conditions A.4.3 Procedure A.4.4 Acceptance criteria |
| 91 | A.5 System validation A.5.1 Purpose A.5.2 Procedure |
| 92 | A.5.3 Validation of modulation response A.5.4 Acceptance criteria Table A.2 โ Communication signals for modulation response test |
| 94 | Annex B (normative)Antennas for system check and system validation tests B.1 General |
| 95 | B.2 Pyramidal horn antennas for system checks Table B.1 โ Target values for pyramidal horn antennas at different frequencies |
| 96 | B.3 Cavity-fed dipole arrays for system validation B.3.1 Description Table B.2 โ Main dimensions for the cavity-fed dipole arraysat each frequency of interest |
| 97 | Figure B.1 โ Main dimensions for the cavity-fed dipole arrays โ 30 GHz design |
| 98 | Table B.3 โ Geometrical parameters of the cavity-fed dipole arraysat each frequency of interest Table B.4 โ Substrate and metallic block parameters for the cavity-fed dipole arrays at each frequency of interest |
| 99 | B.3.2 Numerical target values for cavity-fed dipole arrays B.3.3 Field and power density distribution patterns Table B.5 โ Target values for the cavity-fed dipole arrays at10 GHz, 30 GHz, 60 GHz, and 90 GHz |
| 100 | Figure B.2 โ 10 GHz patterns of |Etotal| and Re{S}total for the cavity-fed dipole arrays at distances ofa) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the dielectric substrate |
| 101 | Figure B.3 โ 30 GHz patterns of |Etotal| and Re{S}total for the cavity-fed dipole arrays at distances ofa) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the dielectric substrate |
| 102 | Figure B.4 โ 60 GHz patterns of |Etotal| and Re{S}total for the cavity-fed dipole arrays at distances ofa) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the dielectric substrate |
| 103 | Figure B.5 โ 90 GHz patterns of |Etotal| and Re{S}total for the cavity-fed dipole arrays at distances ofa) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the dielectric substrate |
| 104 | B.3.4 Far-field radiation patterns |
| 105 | Figure B.6 โ Far-field radiation patterns of a) 10 GHz, b) 30 GHz,c) 60 GHz, and d) 90 GHz cavity-fed dipole arrays |
| 106 | B.4 Pyramidal horns with slot arrays for system validation B.4.1 Description Figure B.7 โ Main dimensions for the 0,15 mm stainless steel stencil with slot array |
| 107 | Figure B.8 โ Main dimensions for the pyramidal horn antennas Table B.6 โ Main dimensions for the stencilwith slot array for each frequency |
| 108 | B.4.2 Numerical target values for pyramidal horns loaded with a slot array Table B.7 โ Primary dimensions for the correspondingpyramidal horns at each frequency |
| 109 | B.4.3 Field and power density distribution patterns Table B.8 โ Target values for the pyramidal horns loaded with slot arraysat 10 GHz, 30 GHz, 60 GHz, and 90 GHz |
| 110 | Figure B.9 โ 10 GHz patterns of |Etotal| and Re{S}total for the pyramidal horn loaded with a slot arrayat distances of a) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the slot array |
| 111 | Figure B.10 โ 30 GHz patterns of |Etotal| and Re{S}total for the pyramidal horn loaded with a slot arrayat distances of a) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the slot array |
| 112 | Figure B.11 โ 60 GHz patterns of |Etotal| and Re{S}total for the pyramidal horn loaded with a slot arrayat distances of a) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the slot array |
| 113 | Figure B.12 โ 90 GHz patterns of |Etotal| and Re{S}total for the pyramidal horn loaded with a slot arrayat distances of a) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the slot array |
| 114 | B.4.4 Far-field radiation patterns |
| 115 | B.5 Antenna validation procedure B.5.1 General Figure B.13 โ Far-field radiation patterns of a) 10 GHz, b) 30 GHz,c) 60 GHz, and d) 90 GHz pyramidal horn loaded with a slot array |
| 116 | B.5.2 Objectives, scope, and usage specifications B.5.3 Antenna design B.5.4 Numerical targets B.5.5 Reference antennas calibration B.5.6 Antenna verification and life expectation B.5.7 Uncertainty budget considerations |
| 117 | B.6 Validation procedure for wideband signals B.6.1 General B.6.2 Validation signals B.6.3 Validation antennas and setup B.6.4 Target values for validation antennas transmitting wideband signals B.6.5 Wideband signal uncertainty |
| 118 | B.6.6 Validation procedure |
| 119 | Annex C (normative)Calibration and characterization of measurement probes C.1 General C.2 Calibration of waveguide probes C.2.1 General C.2.2 Sensitivity C.2.3 Linearity |
| 120 | C.2.4 Lower detection limit C.2.5 Isotropy C.2.6 Response time C.3 Calibration for isotropic scalar E-field or H-field probes C.3.1 General C.3.2 Sensitivity C.3.3 Isotropy |
| 121 | C.3.4 Linearity C.3.5 Lower detection limit C.3.6 Response time C.4 Calibration of phasor E-field or H-field probes C.4.1 General C.4.2 Sensitivity |
| 122 | C.4.3 Isotropy C.4.4 Linearity C.4.5 Lower detection limit C.5 Calibration uncertainty parameters C.5.1 General C.5.2 Input power to the antenna C.5.3 Mismatch effect (input power measurement) |
| 123 | C.5.4 Gain and offset distance C.5.5 Signal spectrum C.5.6 Setup stability |
| 124 | C.5.7 Uncertainty for field impedance variations C.6 Uncertainty budget template Table C.1 โ Uncertainty analysis of the probe calibration |
| 126 | Annex D (informative)Information on use of square or circular shapes for power density averaging area in conformity evaluations D.1 General D.2 Method using computational analysis D.3 Areas averaged with square and circular shapes on planar evaluation surface Figure D.1 โ Schematic view of the assessment of the variationof sPD using square shape by rotating AUT (antenna under test) |
| 127 | Figure D.2 โ Comparison of psPD averaged using square versus circular shaped areas on planar evaluation surfaces |
| 128 | D.4 Areas averaged with square and circular shapes on nonplanar evaluation surface Figure D.3 โ Example PD distributions withdevice next to ear evaluation surface Table D.1 โ Phase shift values for the array antenna |
| 129 | Figure D.4 โ Comparison of psPD averaged using cube cross-section (square-like) versus sphere cross-section (circular-like) shaped areas fordevice next to ear evaluation surface |
| 130 | Annex E (informative)Reconstruction algorithms E.1 General E.2 Methodologies to extract local field components and power densities E.2.1 General |
| 131 | E.2.2 Phase-less approaches E.2.3 Approaches using E-field polarization ellipse measurements E.2.4 Direct near-field measurements |
| 132 | E.3 Forward transformation (propagation) of the fields E.3.1 General Figure E.1 โ Simulation (left) and forward transformation from measurements applying methods described in [29] (right) of power density in the xz-plane (above) and yz-plane (below) at a distance of 2 mm for a cavity-fed dipole array at 30 GHz (see Annex B) |
| 133 | E.3.2 Field expansion methods E.3.3 Field integral equation methods |
| 134 | E.4 Backward transformation (propagation) of the fields E.4.1 General E.4.2 Field expansion methods โ the plane wave expansion |
| 135 | E.4.3 Inverse source methods |
| 136 | E.5 Analytical reference functions Table E.1 โ List of analytical reference functionsand associated psPDn+ target values |
| 137 | Table E.2 โ List of analytical reference functionsand associated psPDtot+ target values Table E.3 โ List of analytical reference functionsand associated psPDmod+ target values |
| 138 | Annex F (normative)Interlaboratory comparisons F.1 Purpose F.2 Reference devices F.3 Power setup F.4 Interlaboratory comparison โ procedure |
| 139 | Annex G (informative)PD test and verification example G.1 Purpose G.2 DUT overview G.3 Test system verification G.4 Test setup G.5 Power density results G.6 Combined exposure (Total Exposure Ratio) |
| 140 | Annex H (informative)Applicability of plane-wave equivalent approximations H.1 Objective H.2 Method H.3 Results |
| 142 | H.4 Discussion Figure H.1 โ psPDpwe / psPDtot as function of distance (in units of ฮป) from cavity-fed dipole array (CDA##G, left-side) and pyramidal horn with slot arrays (SH##G,right-side) operating at 10 GHz, 30 GHz, 60 GHz, and 90 GHz |
| 143 | Annex I (informative)Rationales for concepts and methods applied inthis document and IEC/IEEE 63195-2 I.1 Frequency range I.2 Calculation of sPD I.2.1 Application of the Poynting vector for calculation of incident power density |
| 144 | I.2.2 Averaging area |
| 145 | Bibliography |
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