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BS EN IEC/IEEE 63195-2:2023

$215.11

Assessment of power density of human exposure to radio frequency fields from wireless devices in close proximity to the head and body (frequency range of 6 GHz to 300 GHz) – Computational procedure

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BSI 2023 82
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PDF Pages PDF Title
2 undefined
5 Annex ZA (normative)Normative references to international publicationswith their corresponding European publications
6 Blank Page
7 English
CONTENTS
11 FOREWORD
13 INTRODUCTION
14 1 Scope
2 Normative references
15 3 Terms and definitions
3.1 Exposure metrics and parameters
16 3.2 Spatial, physical, and geometrical parameters associated with exposure metrics
18 3.3 Test device technical operating and antenna parameters
3.4 Computational parameters
19 3.5 Uncertainty parameters
4 Symbols and abbreviated terms
4.1 Symbols
4.1.1 Physical quantities
20 4.1.2 Constants
4.2 Abbreviated terms
21 5 Overview and application of this document
5.1 Overview of the numerical evaluation
22 5.2 Application of this document
Figures
Figure 1 – Overview of the numerical power density evaluation procedure
23 5.3 Stipulations
6 Requirements on the numerical software
24 7 Model development and validation
7.1 General
7.2 Development of the numerical model of the DUT
25 7.3 Power normalization
27 7.4 Requirements on the experimental test equipment for model validation
7.4.1 General
Figure 2 – Power reference planes
28 7.4.2 Ambient conditions and device holder
7.4.3 Power measurement
29 7.5 Testing configurations for the validation of the DUT model
7.5.1 General
7.5.2 Tests to be performed
30 7.5.3 Determining the validity of the DUT model
7.5.4 Test reduction for additional DUTs
31 8 Power density computation and averaging
8.1 Evaluation surface
8.2 Tests to be performed and DUT configurations
8.2.1 General
32 8.2.2 Devices with a single radiating element or with multiple elements that do not operate simultaneously
8.2.3 Devices with antenna arrays or sub-arrays
Figure 3 – Example for configurations of radiating elementsas different antenna sub-arrays on the same DUT
33 8.2.4 Devices with multiple antennas or multiple transmitters
Figure 4 – Flow chart for the evaluation of power density forDUTs with antenna arrays or sub-arrays as described in 8.2.3
34 8.3 Considerations on the evaluation surface and dimensions of the computational domain
8.4 Averaging of power density on an evaluation surface
8.4.1 General
35 8.4.2 Construction of the averaging area on an evaluation surface
36 8.5 Computation of sPD by integration of the Poynting vector
8.5.1 General
8.5.2 Surface-normal propagation-direction power density into the evaluation surface, sPDn+
Figure 5 – Example of the construction of the averaging area withina sphere with fixed radius according to 8.4
37 8.5.3 Total propagating power density into the evaluation surface, sPDtot+
8.5.4 Total power density directed into the phantom considering near-field exposure, sPDmod+
38 8.6 Software
9 Uncertainty evaluation
9.1 General
9.2 Uncertainty of the sPD and of the mpsPD due to the computational parameters
9.2.1 Uncertainty contributions due to the computational parameters
39 9.2.2 Mesh resolution
Tables
Table 1 – Budget of the uncertainty contributions ofthe computational algorithm for the validation setup or testing setup
40 9.2.3 Absorbing boundary conditions
9.2.4 Power budget
9.2.5 Model truncation
9.2.6 Convergence
41 9.2.7 Dielectric properties
9.2.8 Lossy conductors
9.3 Uncertainty contribution of the computational representation of the DUT model
42 9.4 Uncertainty of the maximum exposure evaluation
Table 2 – Budget of the uncertainty of the developed model of the DUT
43 9.5 Uncertainty budget
Table 3 – Computational uncertainty budget
44 10 Reporting
46 Annex A (normative)Code verification
A.1 General
A.2 Interpolation and superposition of vector field components
47 Figure A.1 – Configuration of three λ/2 dipoles, D1, D2, and D3, for the evaluation of the interpolation and superposition of the electric field and magnetic field components
Table A.1 – Interpolation and superposition of vector field components; maximum permissible deviation from the reference results is 10 %
48 A.3 Computation of the far-field pattern and the radiated power
A.4 Implementation of lossy conductors
Table A.2 – Computation of PR; maximum permissible deviation fromthe reference results is 10 % for the radiated power and for the electric field amplitude of the far-field pattern
50 Figure A.2 – R320 waveguide
51 A.5 Implementation of anisotropic dielectrics
Figure A.3 – Cross section of the R320 waveguide showingthe locations of the Ey components to be recorded
Table A.3 – Minimum fine and coarse mesh step for used method
Table A.4 – Results of the evaluation of the computational dispersion characteristics
52 A.6 Computation of the sPD and psPD
A.6.1 General
Table A.5 – Results of the evaluation of the representation of anisotropic dielectrics
53 Table A.6 – Parameters for the incident power density distribution of Formula (A.4)
54 A.6.2 Planar surfaces
Figure A.4 – Si(x,y) computed with Formula (A.4) for the six parametersets of Table A.6 normalized to their maxima
55 A.6.3 Non-planar surfaces
56 Figure A.5 – Cross sections of the symmetric quarters of the testing geometries (SAR Stars) for the benchmarking of the power density averaging algorithm
Figure A.6 – Areas for the computation of the sPD on a cone of the SAR Star
57 A.7 Implementation of the field extrapolation according to the surface equivalence principle
58 Annex B (informative)Experimental evaluation of the radiated power
B.1 General
B.2 Direct conducted power measurements
Table B.1 – Comparison of the experimental methodsfor the evaluation of the radiated power
59 B.3 Radiated power measurement methods
B.4 Information provided by the DUT
60 Annex C (normative)Maximum-exposure evaluation techniques
C.1 General
C.2 Evaluation of EM fields radiated by each antenna element
61 C.3 Evaluation of the mpsPD by superposition of individual EM fields
C.3.1 General
C.3.2 Maximization over the entire codebook by exhaustive search
C.3.3 Optimization with fixed total conducted power
C.3.4 Optimization with fixed power at each port
63 Annex D (informative)Examples of the implementation of power density averaging algorithms
D.1 Example for the evaluation of the psPD on a planar surface
D.1.1 General
D.1.2 Evaluation of the psPD by direct construction of the averaging area
64 D.1.3 Example for the efficient evaluation of the psPD using an equidistant mesh on the evaluation surface
65 D.2 Example for the evaluation of the psPD on a non-planar surface
Figure D.1 – Rotated averaging area on the discretized evaluation surface (base mesh)
66 Figure D.2 – Reduction of the area of triangles thatare partially included in the averaging sphere
67 Annex E (informative)File format for exchange of field data
69 Annex F (informative)Rationales of the methods applied inIEC/IEEE 63195-1 and this document
F.1 Frequency range
F.2 Computation of sPD
F.2.1 Application of the Poynting vector for computation of incident power density
70 F.2.2 Averaging area
71 Annex G (informative)Square averaging area on non-planar evaluation surfaces
G.1 General
G.2 Example implementation for the evaluation of the psPD on a non-planar surface using square-shaped averaging area
72 Annex H (informative)Validation of the maximum-exposure evaluation techniques
H.1 General
H.2 Validation of the exhaustive search
H.2.1 Validation of the exhaustive search
H.2.2 Validation using reconstruction method
H.2.3 Validation of optimization with fixed total conducted power or with fixed power at each port
H.2.4 Validation of the maximum-exposure evaluation of measurement results
73 H.3 Example validation source for maximum-exposure evaluation validation
H.3.1 Description
Table H.1 – Main dimensions for the patch array stencil
Table H.2 – Main dimensions of the validation device
74 Figure H.1 – Main dimensions of patch array stencil
75 H.3.2 Positioning
Figure H.2 – Main dimensions of the validation device, including polypropylene casing
Figure H.3 – Validation device with SAM head in the tilt position
76 H.3.3 Nominal codebook, uncertainty and conducted power PR
H.3.4 Target values
Figure H.4 – Validation device with SAM head in the touch position
77 Table H.3 – Target values for validation device with the nominal codebook
Table H.4 – Target values for validation device with infinite codebook
78 Annex I (normative)Supplemental files and their checksums
79 Bibliography
BS EN IEC/IEEE 63195-2:2023
$215.11