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BS EN ISO 9220:2022

BS EN ISO 9220:2022

$102.76

Metallic coatings. Measurement of coating thickness. Scanning electron microscope method

Published By Publication Date Number of Pages
BSI 2022 20
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This document specifies a destructive method for the measurement of the local thickness of metallic and other inorganic coatings by examination of cross-sections with a scanning electron microscope (SEM). The method is applicable for thicknesses up to several millimetres, but for such thick coatings it is usually more practical to use a light microscope (see ISO 1463). The lower thickness limit depends on the achieved measurement uncertainty (see Clause 10). NOTE       The method can also be used for organic layers when they are neither damaged by the preparation of the cross-section nor by the electron beam during imaging.

PDF Catalog

PDF Pages PDF Title
2 National foreword
4 European foreword
6 Foreword
7 1 Scope
2 Normative references
3 Terms and definitions
4 Principle
5 Instrumentation
5.1 Scanning electron microscope
5.2 Tools to calibrate the length measurement function of the SEM software
8 6 Factors influencing the measurement results
6.1 Surface roughness
6.2 Taper of cross-section
6.3 Specimen tilt
6.4 Coating deformation
6.5 Rounding of edges of the coating
6.6 Plating a protection layer
6.7 Etching
9 6.8 Smearing
6.9 Poor contrast
6.10 Magnification
6.11 SEM imaging parameters
7 Preparation of cross-sections
8 Calibration of instruments
8.1 General
10 8.2 Photography
8.3 Measurement
9 Procedure
10 Precision
10.1 General
10.2 Repeatability, r
11 10.3 Reproducibility limit, R
11 Expression of results
12 Test report
13 Annex A (informative) General guidance on the preparation and measurement of cross-sections
16 Annex B (informative) Details on precision
18 Bibliography

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BS EN ISO 9220:2022
$102.76