BS IEC 61445:2012:2013 Edition
$215.11
Digital Test Interchange Format (DTIF)
| Published By | Publication Date | Number of Pages |
| BSI | 2013 | 112 |
This standard defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
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UUT Model;
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Stimulus and Response;
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Fault Dictionary;
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Probe.
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BS IEC 61445:2012:2013 Edition
Digital Test Interchange Format (DTIF) Published By Publication Date Number of Pages BSI 2013 112
