BSI 20/30409889 DC 2020
$13.70
BS ISO 18114. Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials
Published By | Publication Date | Number of Pages |
BSI | 2020 | 12 |
Status | Definitive |
---|---|
Pages | 12 |
Publication Date | 2020-07-03 |
Standard Number | 20/30409889 DC |
Title | BS ISO 18114. Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials |
Identical National Standard Of | ISO/DIS 18114 |
Descriptors | Homogeneity, Mass spectrometry, Spectroscopy, Chemical composition, Ions, Secondary, Chemical analysis and testing, Test methods, Surface chemistry |
Publisher | BSI |
Committee | CII/60 |
ICS Codes | 71.040.40 - Chemical analysis |