BSI PD IEC/TR 62361-103:2018

$142.49

Power systems management and associated information exchange. Interoperability in the long term – Standard profiling

Published By	Publication Date	Number of Pages
BSI	2018	30

Guaranteed Safe Checkout

Category: BSI

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

This part of IEC 62361, which is a technical report, describes the concepts of standard profiling for Common Information Model (CIM – IEC 61970, IEC 61968, IEC 62325) and IEC 61850 standard series. It serves as an introduction to profiling concepts and methodologies for the development of profiles for providing interoperability. It describes the specific needs and requirements of the standard application domains and derives profiling concepts respectively. Moreover the document defines the foundation for more detailed descriptions in the respective standard series.

PDF Catalog

PDF Pages	PDF Title
2	undefined
4	CONTENTS
5	FOREWORD
7	1 Scope 2 Normative references 3 Terms and definitions
10	4 Profiling concepts 4.1 General 4.1.1 Overview
11	4.1.2 Framework for defining a profile 4.1.3 Framework for profiling Figures Figure 1 – Framework for defining a profile
12	4.1.4 Framework for testing profiles Figure 2 – Framework for profile
13	4.2 Constraints due to the technology used for defining profiles 4.3 Management of extensions to standards Figure 3 – Framework for testing profile
14	4.4 CIM profiling concept 4.4.1 General
15	4.4.2 CIM profile definition Figure 4 – Main steps for profiling CIM Figure 5 – Framework for profiling CIM
16	4.4.3 Requirements 4.4.4 Use cases for CIM profiles 4.4.5 Concept outline
17	4.4.6 Profile development methodology 4.4.7 Profiling process
18	Figure 6 – Relation of contextual model artefacts
19	Figure 7 – Process of profiling CIM
20	4.5 IEC 61850 profiling concept 4.5.1 General 4.5.2 IEC 61850 profile definition Figure 8 – Framework for profiling IEC 61850
21	4.5.3 IEC 61850 field or items which may be considered when profiling
22	4.5.4 Requirements 4.5.5 Concept Outline
23	Figure 9 – Aggregating BAPs
25	4.5.6 Profile related processes Figure 10 – Concept of BAPs and BAIOPs
26	4.6 CIM and IEC 61850 profiling comparison and common profiling rules Figure 11 – CIM and IEC 61850 profiling comparison
27	Figure 12 – Potential similarities of profiling concepts
28	Bibliography