IEEE C62.37 1996:1997 Edition

$66.08

IEEE Standard Test Specification for Thyristor Diode Surge Protective Devices

Published By	Publication Date	Number of Pages
IEEE	1997	56

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Description

New IEEE Standard – Active. This standard applies to two or three terminal, four or five layer, thyristor surge protection devices (SPDs) for application on systems with voltages equal to or less than 1000 V rms or 1200 V dc.

PDF Catalog

PDF Pages	PDF Title
1	Title page
3	Introduction
4	Participants
6	CONTENTS
7	1. Overview 1.1 Scope 1.2 Tests 1.3 Applicability and device function
8	2. Definitions of rated and other parameters 2.1 Rated parameter values 2.2 Definitions
9	2.3 Additional definitions
10	2.4 Temperature dependence of parameters
11	2.5 Gated thyristor surge protection device (SPD)
16	3. Service condition 3.1 Normal service conditions
17	3.2 Unusual service conditions 4. Standard design test procedure 4.1 Standard design test criteria
18	4.2 Statistical analysis 4.3 Thyristor surge protection device (SPD) test conditions
19	4.4 Rating test proecdures
24	4.5 Characteristic test procedures
49	5. Failure modes 5.1 Degradation failure mode 5.2 Catastrophic failure mode
50	5.3 “Fail-safe” operation
51	Annex A—Thyristor terms
56	Annex B—Bibliography