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31.080 - Semiconductor devices

Showing 113–128 of 1120 results

  • JIS C 7031:1993

    JIS C 7031:1993

    Measuring methods for small signal diodes Published By Publication Date Number of Pages JIS 1993-02-01…

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  • JIS C 7030:1993

    JIS C 7030:1993

    Measuring methods for transistors Published By Publication Date Number of Pages JIS 1993-02-01 101

    $49.40 Add to cart
  • JIS C 6790:2010

    JIS C 6790:2010

    Load test of a bolt-clamped Langevin vibrator using wattmeter method Published By Publication Date Number…

    $18.20 Add to cart
  • JIS C 5947:2005

    JIS C 5947:2005

    Measuring methods of laser diode modules for optical fiber amplifier Published By Publication Date Number…

    $27.30 Add to cart
  • JIS C 5946:2005

    JIS C 5946:2005

    General rules of laser diode modules for optical fiber amplifier Published By Publication Date Number…

    $24.70 Add to cart
  • JIS C 5945:1996

    JIS C 5945:1996

    Test methods of laser diode modules for fiber optic transmission Published By Publication Date Number…

    $21.45 Add to cart
  • JIS C 5944:1996

    JIS C 5944:1996

    General rules of laser diode modules for fiber optic transmission Published By Publication Date Number…

    $21.45 Add to cart
  • JIS C 5381-321:2004

    JIS C 5381-321:2004

    Components for Low-Voltage Surge Protective Devices – Specifications for Avalanche Breakdown Diode (ABD) Published By…

    $29.90 Add to cart
  • JIS C 5381-341:2005

    JIS C 5381-341:2005

    Components for low-voltage surge protective devices – Part 341: Specification for thyristor surge suppressors (TSS)…

    $71.50 Add to cart
  • IEC TS 60747-19-2:2021

    IEC TS 60747-19-2:2021

    Semiconductor devices – Part 19-2: Smart sensors – Indication of specifications of sensors and power…

    $33.15 Add to cart
  • IEC TR 63133:2017

    IEC TR 63133:2017

    Semiconductor devices – Scan based ageing level estimation for semiconductor devices Published By Publication Date…

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  • IEC TR 62380:2004

    IEC TR 62380:2004

    Reliability data handbook – Universal model for reliability prediction of electronics components, PCBs and equipment…

    $76.05 Add to cart
  • IEC TR 62258-7:2007

    IEC TR 62258-7:2007

    Semiconductor die products – Part 7: XML schema for data exchange Published By Publication Date…

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  • IEC TR 62258-4:2012

    IEC TR 62258-4:2012

    Semiconductor die products – Part 4: Questionnaire for die users and suppliers Published By Publication…

    $33.15 Add to cart
  • IEC TR 62258-3:2010

    IEC TR 62258-3:2010

    Produits à puces de semi-conducteurs – Partie 3 : bonnes pratiques recommandées pour la manipulation,…

    $68.90 Add to cart
  • IEC TR 60828:1988

    IEC TR 60828:1988

    Allocation des broches de connecteurs pour les systèmes à microprocesseurs utilisant le connecteur IEC 603-2…

    $6.50 Add to cart