{"id":111130,"date":"2024-10-18T16:06:24","date_gmt":"2024-10-18T16:06:24","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1445-1998\/"},"modified":"2024-10-24T22:00:26","modified_gmt":"2024-10-24T22:00:26","slug":"ieee-1445-1998","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1445-1998\/","title":{"rendered":"IEEE 1445 1998"},"content":{"rendered":"

New IEEE Standard – Active. The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are dened. This information can be broadly grouped into data that denes the following: UUT Model, Stimulus and Response, Fault Dictionary, and Probe.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nTitlepage <\/td>\n<\/tr>\n
3<\/td>\nIntroduction <\/td>\n<\/tr>\n
5<\/td>\nCONTENTS <\/td>\n<\/tr>\n
7<\/td>\n1. Overview
1.1 Scope
1.2 Purpose
1.3 Application <\/td>\n<\/tr>\n
8<\/td>\n2. References
3. Definitions and acronyms
3.1 Definitions <\/td>\n<\/tr>\n
10<\/td>\n3.2 Acronyms
4. Data organization overview of the DTIF standard environment <\/td>\n<\/tr>\n
11<\/td>\n4.1 UUT Model Group
4.2 Stimulus and Response Group
4.3 Fault Dictionary Group
4.4 Probe Group <\/td>\n<\/tr>\n
12<\/td>\n5. File specifications <\/td>\n<\/tr>\n
13<\/td>\n5.1 HEADER file <\/td>\n<\/tr>\n
15<\/td>\n5.2 STIMULUS file <\/td>\n<\/tr>\n
16<\/td>\n5.3 PO_RESPONSE file <\/td>\n<\/tr>\n
17<\/td>\n5.4 PI_NAMES file <\/td>\n<\/tr>\n
18<\/td>\n5.5 PO_NAMES file <\/td>\n<\/tr>\n
19<\/td>\n5.6 MAIN_MODEL file <\/td>\n<\/tr>\n
20<\/td>\n5.7 COMPONENT_TYPE file <\/td>\n<\/tr>\n
21<\/td>\n5.8 USER_NODE file <\/td>\n<\/tr>\n
22<\/td>\n5.9 INPUT_PIN_NAMES file <\/td>\n<\/tr>\n
23<\/td>\n5.10 OUTPUT_PIN_NAMES file <\/td>\n<\/tr>\n
24<\/td>\n5.11 NEAR_FROMS_POINTERS file <\/td>\n<\/tr>\n
25<\/td>\n5.12 NEAR_FROMS file <\/td>\n<\/tr>\n
26<\/td>\n5.13 EVENT file <\/td>\n<\/tr>\n
28<\/td>\n5.14 SETTLED_STATE_ONLY file <\/td>\n<\/tr>\n
29<\/td>\n5.15 SETTLED_STATE_&_PULSES file <\/td>\n<\/tr>\n
31<\/td>\n5.16 NODE_SOURCE file <\/td>\n<\/tr>\n
32<\/td>\n5.17 STEPS file <\/td>\n<\/tr>\n
33<\/td>\n5.18 F.D._POPATS file <\/td>\n<\/tr>\n
34<\/td>\n5.19 F.D._FAULT_SIGNATURES file <\/td>\n<\/tr>\n
36<\/td>\n5.20 F.D._PRINT_STRINGS file <\/td>\n<\/tr>\n
38<\/td>\n5.21 TRISTATE_FROMS_POINTERS file <\/td>\n<\/tr>\n
39<\/td>\n5.22 TRISTATE_FROMS file <\/td>\n<\/tr>\n
40<\/td>\n5.23 PSEUDOPI_NAMES file <\/td>\n<\/tr>\n
41<\/td>\n5.24 TIMING_SETS file <\/td>\n<\/tr>\n
43<\/td>\n5.25 TIMING_PER_PATTERN file <\/td>\n<\/tr>\n
44<\/td>\n5.26 PHASE_CONNECTIONS file <\/td>\n<\/tr>\n
45<\/td>\n5.27 AUXILIARY_PIN_NAMES file <\/td>\n<\/tr>\n
46<\/td>\n5.28 PI_FORMATS file <\/td>\n<\/tr>\n
47<\/td>\n5.29 FORMAT_ATTRIBUTES file <\/td>\n<\/tr>\n
48<\/td>\n5.30 F.D. _CROSS_REFERENCE file <\/td>\n<\/tr>\n
49<\/td>\n5.31 PROBETAG_ DEFINITIONS file <\/td>\n<\/tr>\n
51<\/td>\n5.32 PROBETAG_ASSIGNMENTS file <\/td>\n<\/tr>\n
52<\/td>\n5.33 BURSTS file <\/td>\n<\/tr>\n
53<\/td>\n5.34 STIMULUS_TEXT file <\/td>\n<\/tr>\n
54<\/td>\n5.35 NODE_NAMES file <\/td>\n<\/tr>\n
55<\/td>\n5.36 EVENTS_INIT file <\/td>\n<\/tr>\n
57<\/td>\n5.37 EQUIV_FAULTS file <\/td>\n<\/tr>\n
58<\/td>\n5.38 PROBE_DETECTION file <\/td>\n<\/tr>\n
59<\/td>\n5.39 F.D._EQUIV_SETS file <\/td>\n<\/tr>\n
60<\/td>\n6. Conformance
6.1 End-to-end test
6.2 Diagnostic test using fault dictionary <\/td>\n<\/tr>\n
62<\/td>\n6.3 Diagnostic test using probe <\/td>\n<\/tr>\n
65<\/td>\nAnnex A. Implementation overview <\/td>\n<\/tr>\n
67<\/td>\nAnnex B. DTIF dependency diagrams <\/td>\n<\/tr>\n
72<\/td>\nAnnex C. Example circuit <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Standard for Digital Test Interchange Format (DTIF)<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n1999<\/td>\n105<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":111131,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-111130","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/111130","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/111131"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=111130"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=111130"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=111130"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}