{"id":239615,"date":"2024-10-19T15:40:33","date_gmt":"2024-10-19T15:40:33","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-pd-iec-ts-62647-42018\/"},"modified":"2024-10-25T10:23:01","modified_gmt":"2024-10-25T10:23:01","slug":"bsi-pd-iec-ts-62647-42018","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-pd-iec-ts-62647-42018\/","title":{"rendered":"BSI PD IEC\/TS 62647-4:2018"},"content":{"rendered":"

This part of IEC 62647, which is a Technical Specification, defines the requirements for replacing solder balls on ball grid array (BGA) component packages in the context of an electronic components management plan (ECMP) for aerospace, defence and high reliability products.<\/p>\n

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NOTE 1 IEC TS 62239-1 and EIA-STD-4899 describe the electronic components management program (ECMP).<\/p>\n<\/blockquote>\n

It does not apply to column grid array (CGA) components or chip scale components.<\/p>\n

This re-balling document addresses two types of configurations. For other configuration types, see Annex A for tailoring.<\/p>\n