{"id":291122,"date":"2024-10-19T19:45:50","date_gmt":"2024-10-19T19:45:50","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-119522019\/"},"modified":"2024-10-25T16:47:16","modified_gmt":"2024-10-25T16:47:16","slug":"bs-iso-119522019","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-119522019\/","title":{"rendered":"BS ISO 11952:2019"},"content":{"rendered":"

This document specifies methods for characterizing and calibrating the scan axes of scanning-probe microscopes (SPMs) for measuring geometric quantities at the highest level. It is applicable to those providing further calibrations and is not intended for general industry use, where a lower level of calibration might be required.<\/p>\n

This document has the following objectives:<\/p>\n