{"id":318361,"date":"2024-10-19T21:59:16","date_gmt":"2024-10-19T21:59:16","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-196062017\/"},"modified":"2024-10-25T20:16:46","modified_gmt":"2024-10-25T20:16:46","slug":"bs-iso-196062017","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-196062017\/","title":{"rendered":"BS ISO 19606:2017"},"content":{"rendered":"
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
6<\/td>\n | Foreword <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 4 Test environment 5 Roughness measurement specimens 6 Test apparatus 6.1 Cantilever 6.2 Scanner <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 6.3 Specimen stage 7 Test apparatus calibration <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 8 Probe-tip diameter evaluation standard plate 9 Calibration of X-Y and Z scan axes <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 10 Probe-tip error evaluation 10.1 Outline of probe-tip error evaluation <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 10.2 Measurements of preliminary Ra and RSm 10.3 Evaluation of probe-tip diameter <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 10.4 Evaluation of error in roughness measurements <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | 11 Roughness measurements of specimen <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 12 Test report <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | Annex\u00a0A (normative) Determination of D from D\u2019 <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | Annex\u00a0B (informative) Method to determine criteria for probe-tip error <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for surface roughness of fine ceramic films by atomic force microscopy<\/b><\/p>\n |