{"id":416996,"date":"2024-10-20T06:13:47","date_gmt":"2024-10-20T06:13:47","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-60512-26-1002008a12011-2\/"},"modified":"2024-10-26T11:34:49","modified_gmt":"2024-10-26T11:34:49","slug":"bs-en-60512-26-1002008a12011-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-60512-26-1002008a12011-2\/","title":{"rendered":"BS EN 60512-26-100:2008+A1:2011"},"content":{"rendered":"
This part of IEC 60512 specifies the test and measurements and the related measurement setup and reference arrangements for interoperability and backward compatibility tests for the development and qualification of 8-way, free and fixed connectors for data transmission.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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7<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 1 Scope 2 Normative reference <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 3 General requirements for measurement setup 3.1 Test instrumentation 3.2 Coaxial cables and test leads for network analysers 3.3 Measurement precautions <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 3.4 Balun requirements Figures Figure 1 \u2013 Optional 180( hybrid used instead of a balun Tables Table 1 \u2013 Test balun performance characteristics <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 3.5 Reference components for calibrations 3.6 Termination loads for termination of conductor pairs Figure 2 \u2013 Example of calibration of reference loads <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 3.7 Termination of screens 3.8 Test specimen and reference planes Figure 3 \u2013 Resistor load <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 3.9 Termination of balun with low return loss for common mode Figure 4 \u2013 Definition of reference planes Figure 5 \u2013 Balanced attenuator for balun centre tap grounded <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 4 Connector measurement up to 250\u00a0MHz 4.1 Insertion loss (IL), Test 26a Figure 6 \u2013 Balanced attenuator for balun centre tap open <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | Figure 7 \u2013 Calibration Figure 8 \u2013 Measuring set-up <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 4.2 Return loss (RL), Test 26b <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | 4.3 Near-end crosstalk (NEXT), Test 26c Table 2 \u2013 Uncertainty band of return loss measurement at frequencies below 100\u00a0MHz Table 3 \u2013 Uncertainty band of return loss measurement at frequencies above 100\u00a0MHz <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | Figure 9 \u2013 NEXT measurement for differential and common mode terminations <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | 4.4 Far-end crosstalk (FEXT), Test 26d <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | Figure 10 \u2013 FEXT measurement for differential and common mode terminations <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | 4.5 Transfer impedance (ZT), Test 26e <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | Figure 11 \u2013 Preparation of test specimen <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | Figure 12 \u2013 Triaxial test set-up <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | Figure 13 \u2013 Impedance matching for R1 < 50 \u03a9 <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | Figure 14 \u2013 Impedance matching for R1 > 50 \u03a9 <\/td>\n<\/tr>\n | ||||||
31<\/td>\n | 4.6 Transverse Conversion Loss (TCL), Test 26f Figure 15 \u2013 TCL measurement <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | 4.7 Transverse Conversion Transfer Loss (TCTL), Test 26g <\/td>\n<\/tr>\n | ||||||
33<\/td>\n | Figure 16 \u2013 TCTL measurement <\/td>\n<\/tr>\n | ||||||
34<\/td>\n | 5 Construction and qualification of test plugs 5.1 De-embedding near-end crosstalk (NEXT) test plug Figure 17 \u2013 Back-to-back through calibration (for more information, see Annex A) <\/td>\n<\/tr>\n | ||||||
36<\/td>\n | Table 4 \u2013 De-embedded NEXT real and imaginary reference jack vectors <\/td>\n<\/tr>\n | ||||||
37<\/td>\n | Table 5 \u2013 Differential mode reference jack vectors <\/td>\n<\/tr>\n | ||||||
38<\/td>\n | Table 6 \u2013 Test plug NEXT loss limits for connectors specified up to 100 MHz according to IEC 60603-7-2 or IEC 60603-7-3 <\/td>\n<\/tr>\n | ||||||
39<\/td>\n | Table 7 \u2013 Test plug NEXT loss limits for connectors specified up to 250 MHz according to IEC 60603-7-4 or IEC 60603-7-5 <\/td>\n<\/tr>\n | ||||||
40<\/td>\n | 5.2 Far-end crosstalk (FEXT) test plug Table 8 \u2013 Test-plug differential and differential with common-mode consistency <\/td>\n<\/tr>\n | ||||||
41<\/td>\n | Figure 18 \u2013 Mated test plug\/direct fixture test configuration <\/td>\n<\/tr>\n | ||||||
42<\/td>\n | 5.3 Return loss test plug 6 Reference plug and jack construction and measurement \u2013 the basics of the de-embedding test method 6.1 De-embedding near-end crosstalk (NEXT) reference plug and jack Table 9 \u2013 Test plug FEXT requirements \u2013 De-embedding method <\/td>\n<\/tr>\n | ||||||
43<\/td>\n | Figure 19 \u2013 De-embedding reference plug <\/td>\n<\/tr>\n | ||||||
44<\/td>\n | 6.2 De-embedding near-end crosstalk (NEXT) reference jack Table 10 \u2013 Return loss requirements for return loss reference plug <\/td>\n<\/tr>\n | ||||||
45<\/td>\n | Figure 20 \u2013 De-embedding reference jack <\/td>\n<\/tr>\n | ||||||
46<\/td>\n | 6.3 Determining reference jack FEXT vector Figure 21 \u2013 De-embedding reference FEXT plug without sockets <\/td>\n<\/tr>\n | ||||||
47<\/td>\n | Figure 22 \u2013 De-embedding reference FEXT plug with sockets Figure 23 \u2013 Reference FEXT plug mated to PWB <\/td>\n<\/tr>\n | ||||||
48<\/td>\n | Figure 24 \u2013 Reference FEXT plug-test lead position Figure 25 \u2013 Reference FEXT plug assembly <\/td>\n<\/tr>\n | ||||||
50<\/td>\n | Figure 26 \u2013 Test leads connected to de-embedded reference jack\/PWB assembly Figure 27 \u2013 Reference FEXT plug mated to reference jack\/PWB assembly <\/td>\n<\/tr>\n | ||||||
51<\/td>\n | Annex A (informative) Example test fixtures in support Figure A.1 \u2013 THI3KIT test head interface with baluns attached Table A.1 \u2013 Coaxial termination reference head component list <\/td>\n<\/tr>\n | ||||||
52<\/td>\n | Table A.2 \u2013 Coaxial termination reference head, additional parts <\/td>\n<\/tr>\n | ||||||
53<\/td>\n | Figure A.2 \u2013 Alternative to item 3.1 in Table A.2 Figure A.3 \u2013 Pyramid test setup for shielded connectors <\/td>\n<\/tr>\n | ||||||
54<\/td>\n | Table A.3 \u2013 Coaxial termination reference head component list <\/td>\n<\/tr>\n | ||||||
55<\/td>\n | Figure A.4 \u2013 Exploded assembly of the coaxial termination reference test head Figure A.5 \u2013 Detailed view of the coaxial termination reference test-head interface <\/td>\n<\/tr>\n | ||||||
57<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Connectors for electronic equipment. Tests and measurements – Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 Tests 26a to 26g<\/b><\/p>\n |