This Technical Report summarises present perspectives on the performance evaluation of emerging PV technologies, specifically OPV, DSC and PSC devices. These devices present some challenges for accurate measurement under the existing IEC 60904 series of standards, which were developed in the context of silicon wafer solar cells. These challenges can be different for different devices, but in general they arise due to one or more of the following: instability in performance over time; unusual spectral responsivity; small device size; difficulty in measuring temperature; a transient response to external stimulus; optical interference effects; and a non-linear current response to irradiance. These challenges can lead to the cell output in laboratory testing being significantly different to the output that would be observed in a real application.<\/p>\n
The primary focus of the report is measurement of the current-voltage (I-V<\/i>) relationship under illumination for the purpose of determining the device output power, or power conversion efficiency. Where appropriate, the report makes reference to the IEC 60904 series which describes the standard approach to measuring the performance of all PV devices. The report also references existing published standards that seek to accommodate OPV, DSC or PSC devices.<\/p>\n
The report does not seek to find consensus on measurement protocols at this stage. A lot of work has been done by the community toward that aim, but more work is needed. The report therefore seeks to document current knowledge and practices, hence serving as a reference and a tool for conducting further discussion. It is hoped that by identifying the issues that remain unresolved, the report will focus efforts toward resolving those issues, such that a guiding Technical Specification can be prepared in the near future. A robust Technical Specification will bring clarity and confidence to the markets for these PV products as they develop.<\/p>\n
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| 2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
| 4<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
| 6<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 8<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
| 9<\/td>\n | 1 Scope 2 Normative references 3 Terms, definitions and conventions 3.1 Terms and definitions <\/td>\n<\/tr>\n | ||||||
| 10<\/td>\n | 3.2 Conventions 4 Draft terminology for discussion 4.1 General 4.2 Draft terms 4.2.1 Steady-state 4.2.2 Pre-conditioning <\/td>\n<\/tr>\n | ||||||
| 11<\/td>\n | 4.2.3 Stabilization 5 Pre-conditioning 5.1 General 5.2 Review of currently available standards 5.2.1 IEC 60904-1 <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | 5.2.2 SEMI-PV57 5.3 Some examples of pre-conditioning procedures applied to OPV\/DSC\/PSC 5.3.1 General 5.3.2 Avoidance of light soaking <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | 5.3.3 Pre-conditioning by light soaking 5.3.4 Recognition of a diurnal instability <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | 5.4 Summary and suggestions <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | 6 I-V measurement 6.1 General 6.2 Review of currently available standards 6.2.1 IEC 60904-1 6.2.2 SEMI-PV57 <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | 6.2.3 OITDA-PV01-2009 6.2.4 JIS (Japanese Industrial Standards) 6.3 Some examples of IV procedures applied to OPV\/DSC\/PSC 6.3.1 General <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | 6.3.2 Criteria for a steady state measurement 6.3.3 Criteria for agreement between forward and reverse IV curves 6.3.4 Flow charts for IV measurement of PV devices showing transient effects <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | Figure 1 \u2013 Example flowchart for the electrical characterization of OPV\/DSC\/PSC <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | 6.3.5 Special methods Figure 2 \u2013 Alternative flowchart for devices exhibiting long-term drift <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | 6.4 Summary and suggestions <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | 7 Reference cell 7.1 General <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | 7.2 Review of currently available standards 7.2.1 IEC 60904-2 7.2.2 SEMI-PV57 7.2.3 OITDA-PV01-2009 Table 1 \u2013 Filtered c-Si reference cell <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | 7.2.4 JIS C 8904-2 7.2.5 ASTM E1040 7.3 Common practices for reference cells for OPV\/DSC\/PSC <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | 7.4 Summary and suggestions Table 2 \u2013 Typical AM1.5G spectral mismatch errors for various device\/reference combinations for an AM1.5G-filtered Xe arc lamp <\/td>\n<\/tr>\n | ||||||
| 25<\/td>\n | 8 Spectral responsivity measurement 8.1 General 8.2 Review of currently available standards 8.2.1 IEC 60904-8 <\/td>\n<\/tr>\n | ||||||
| 26<\/td>\n | 8.2.2 ASTM E1021 <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | 8.3 Practices for spectral responsivity on OPV\/DSC\/PSC devices 8.3.1 Determining the chopping frequency for devices with a transient response 8.4 Summary and suggestions 9 Sample preparation 9.1 General <\/td>\n<\/tr>\n | ||||||
| 28<\/td>\n | 9.2 Elements of effective packaging 9.2.1 Rear-side support 9.2.2 Wiring 9.2.3 Aperture masking 9.3 A note on sample size <\/td>\n<\/tr>\n | ||||||
| 29<\/td>\n | 9.4 Summary and suggestions 10 Temperature control 10.1 General 10.2 Review of currently available standards 10.3 Current practices in temperature measurement\/control for OPV\/DSC\/PSC 10.3.1 Keeping the exposure time short using a shutter <\/td>\n<\/tr>\n | ||||||
| 30<\/td>\n | 10.3.2 Use of a temperature sensor and a temperature-controlled stage 10.4 Summary and suggestions 11 Non-standard testing light condition 11.1 General 11.2 Review of currently available standards 11.2.1 General <\/td>\n<\/tr>\n | ||||||
| 31<\/td>\n | 11.2.2 JEITA 11.2.3 SEMI 11.2.4 CIE spectra 11.3 Practical issues when using illumination sources to characterise PV cells <\/td>\n<\/tr>\n | ||||||
| 32<\/td>\n | 11.4 Summary and suggestions 12 Tandem solar cells 12.1 General 12.2 Review of currently available standards <\/td>\n<\/tr>\n | ||||||
| 33<\/td>\n | 12.3 Practical issues in applying the existing standards for OPV\/DSC\/PSC 12.4 Summary and suggestions <\/td>\n<\/tr>\n | ||||||
| 34<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Measurement protocols for photovoltaic devices based on organic, dye-sensitized or perovskite materials<\/b><\/p>\n |