| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 7<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 9<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
| 10<\/td>\n | 1 Scope 2 Normative references 3 Terms, definitions, abbreviated terms and symbols 3.1 General definitions <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | 3.2 Definitions related to measuring devices <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | 3.3 Abbreviated terms 3.4 Symbols 4 Sources of uncertainty in a system for accuracy test 4.1 Reference IT <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | 4.2 Comparator 4.3 Burden 4.4 Voltage\/current source 4.5 General considerations on other sources of uncertainties arising in accuracy test setups <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 4.6 Sources of uncertainty in special applications 5 Requirements 5.1 Reference IT <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | 5.2 Comparator <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | 5.3 Burden 5.4 Voltage\/current source 5.5 Special applications 6 On-site accuracy test or verification of ITs 6.1 Purpose of on-site accuracy test or verification <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | 6.2 Interval of on-site accuracy test or verification 6.3 Requirements and sources of uncertainty <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | 7 Procedures for accuracy tests of ITs 7.1 Overview 7.2 Methods to evaluate errors of ITs with digital comparators <\/td>\n<\/tr>\n | ||||||
| 25<\/td>\n | 7.3 Connections in the accuracy test setup <\/td>\n<\/tr>\n | ||||||
| 26<\/td>\n | 7.4 Burden connection 7.5 Demagnetization of inductive CTs 7.6 Selection of the time acquisition interval 7.7 Selection of the sampling frequency <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | 7.8 Procedure for applying the Type A method in uncertainty evaluation 7.9 Procedures for on-site accuracy tests of ITs <\/td>\n<\/tr>\n | ||||||
| 29<\/td>\n | 7.10 Evaluation of uncertainty affecting the measurement of IT errors 7.10.1 General 7.10.2 Preparation of the equations for the measurement model <\/td>\n<\/tr>\n | ||||||
| 32<\/td>\n | 7.10.3 Definition of the measurement model <\/td>\n<\/tr>\n | ||||||
| 34<\/td>\n | 7.10.4 Contributions from calibration or conformity certificates 7.10.4.1 Contributions from calibration certificates 7.10.4.2 Contributions from conformity certificates <\/td>\n<\/tr>\n | ||||||
| 35<\/td>\n | 7.10.5 Preparation of the tables for calculating the uncertainty budget 7.11 Procedures in special applications <\/td>\n<\/tr>\n | ||||||
| 36<\/td>\n | Annex A (informative) Calculation of the expanded uncertainty in accuracy tests of ITs A.1 Example of calculation of an uncertainty budget A.1.1 Contributions from calibration certificates A.1.2 Setup- and DUT-specific contributions <\/td>\n<\/tr>\n | ||||||
| 37<\/td>\n | A.1.3 Fluctuations of the comparator readings <\/td>\n<\/tr>\n | ||||||
| 39<\/td>\n | A.1.4 Calculation of the expanded uncertainty <\/td>\n<\/tr>\n | ||||||
| 40<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" BS IEC\/IEEE 61869-21 Instrument transformers – Part 21. Uncertainty evaluation in the calibration of Instrument Transformers<\/b><\/p>\n |